X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film

M. Steffenelli; Rostislav Daniel; W Ecker; Daniel Kiener; Juraj Todt; A. Zeilinger; Christian Mitterer; M. Burghammer; Jozef Keckes

doi:10.1016/j.actamat.2014.11.011

X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film

M. Steffenelli, Rostislav Daniel, W Ecker, Daniel Kiener, Juraj Todt, A. Zeilinger, Christian Mitterer, M. Burghammer, Jozef Keckes

Research output: Contribution to journal › Article › Research › peer-review

39 Citations (Scopus)

Translated title of the contribution	X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film
Original language	English
Pages (from-to)	24-31
Journal	Acta materialia
Volume	85
DOIs	https://doi.org/10.1016/j.actamat.2014.11.011
Publication status	Published - 2015

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10.1016/j.actamat.2014.11.011

Cite this

@article{33beb50064ec4d208ca0b84f9d903074,

title = "X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film",

author = "M. Steffenelli and Rostislav Daniel and W Ecker and Daniel Kiener and Juraj Todt and A. Zeilinger and Christian Mitterer and M. Burghammer and Jozef Keckes",

year = "2015",

doi = "10.1016/j.actamat.2014.11.011",

language = "English",

volume = "85",

pages = "24--31",

journal = "Acta materialia",

issn = "1359-6454",

publisher = "Elsevier",

}

TY - JOUR

T1 - X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film

AU - Steffenelli, M.

AU - Daniel, Rostislav

AU - Ecker, W

AU - Kiener, Daniel

AU - Todt, Juraj

AU - Zeilinger, A.

AU - Mitterer, Christian

AU - Burghammer, M.

AU - Keckes, Jozef

PY - 2015

Y1 - 2015

U2 - 10.1016/j.actamat.2014.11.011

DO - 10.1016/j.actamat.2014.11.011

M3 - Article

SN - 1359-6454

VL - 85

SP - 24

EP - 31

JO - Acta materialia

JF - Acta materialia

ER -