X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films

Jozef Keckes, Matthias Bartosik, Rostislav Daniel, Christian Mitterer, Günther Alois Maier, W Ecker, J. Vila-Comamala, C. David, Sebastian Schoeder, M. Burghammer

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Translated title of the contributionX-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
Original languageEnglish
Pages (from-to)748-751
JournalScripta materialia
Volume67
DOIs
Publication statusPublished - 2012

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