X-ray line profile analysis-An ideal tool to quantify structural parameters of nanomaterials

Michael B. Kerber, Michael J. Zehetbauer, Erhard Schafler, Florian C. Spieckermann, Sigrid Bernstorff, Tamas Ungar

Research output: Contribution to journalArticleResearchpeer-review

35 Citations (Scopus)
Original languageEnglish
JournalJOM
Volume63
Issue number7
DOIs
Publication statusPublished - 1 Jul 2011
Externally publishedYes

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