| Translated title of the contribution | X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison |
|---|---|
| Original language | English |
| Pages (from-to) | 1-8 |
| Journal | Journal of applied crystallography |
| Volume | 46 |
| DOIs | |
| Publication status | Published - 2013 |
X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison
M. Steffenelli, Juraj Todt, Angelika Riedl, W Ecker, T. Müller, Rostislav Daniel, M. Burghammer, Jozef Keckes
Research output: Contribution to journal › Article › Research › peer-review
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(Scopus)