Understanding amorphization mechanisms using ion irradiation in situ a TEM and 3D damage reconstruction

Osmane Camara, Matheus A. Tunes, Graeme Greaves, Anamul H. Mir, Stephen Donnelly, Jonathan A. Hinks

Research output: Contribution to journalArticleResearchpeer-review

3 Citations (Scopus)
Original languageEnglish
Article number112838
JournalUltramicroscopy
Volume207
DOIs
Publication statusPublished - 1 Dec 2019
Externally publishedYes

Keywords

  • Amorphization mechanisms
  • Displacement per atom
  • In-situ TEM
  • Radiation damage
  • Semiconductors

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