Thermally-induced stresses in thin aluminum layers grown on silicon

Ernst Eiper, R. Resel, C. Eisenmenger-Sittner, M. Hafok, Jozef Keckes

Research output: Contribution to journal › Article › Research › peer-review

9 Citations (Scopus)

Translated title of the contribution	Thermally-induced stresses in thin aluminum layers grown on silicon
Original language	English
Pages (from-to)	74-76
Journal	Powder diffraction
Publication status	Published - 2004

Cite this

@article{6f841d30f0704ffd8fd2503160ef80c6,

title = "Thermally-induced stresses in thin aluminum layers grown on silicon",

author = "Ernst Eiper and R. Resel and C. Eisenmenger-Sittner and M. Hafok and Jozef Keckes",

year = "2004",

language = "English",

pages = "74--76",

journal = "Powder diffraction",

issn = "0885-7156",

publisher = "Cambridge University Press",

}