The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction

C. M. Fancher, S. Brewer, C. C. Chung, Sören Röhrig, T. Rojac, G. Esteves, Marco Deluca, N. Bassiri-Gharb, J. L. Jones

Research output: Contribution to journalArticleResearchpeer-review

24 Citations (Scopus)
Original languageEnglish
Pages (from-to)36-43
Number of pages8
JournalActa materialia
Publication statusPublished - 2017


  • In situ X-ray diffraction 180° domain reversal Domain wall motion Non-linear piezoelectric Non-linear dielectric

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