Original language | English |
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Journal | Surface and interface analysis |
Publication status | Published - 1 Apr 2017 |
Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%
Lukas Kormos, Markus Kratzer, Konrad Kostecki, Michael Oehme, Tomas Sikola, Erich Kasper, Jörg Schulze, Christian Teichert
Research output: Contribution to journal › Article › Research › peer-review
12
Citations
(Scopus)