Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%

Lukas Kormos, Markus Kratzer, Konrad Kostecki, Michael Oehme, Tomas Sikola, Erich Kasper, Jörg Schulze, Christian Teichert

Research output: Contribution to journalArticleResearchpeer-review

12 Citations (Scopus)
Original languageEnglish
JournalSurface and interface analysis
Publication statusPublished - 1 Apr 2017

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