Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction

Research output: Contribution to conferencePosterResearchpeer-review

Translated title of the contributionStructure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction
Original languageEnglish
Publication statusPublished - 2012
Event9th International Conference on Residual Stresses, ICRS 2012 - Garmisch-Partenkirchen, Austria
Duration: 7 Oct 20129 Oct 2012

Conference

Conference9th International Conference on Residual Stresses, ICRS 2012
Country/TerritoryAustria
CityGarmisch-Partenkirchen
Period7/10/129/10/12

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