Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM

S. Cazottes, Z.L. Zhang, R. Daniel, J.S. Chawla, D. Gall, G. Dehm

Research output: Contribution to journalArticleResearchpeer-review

20 Citations (Scopus)
Original languageEnglish
JournalThin solid films
DOIs
Publication statusPublished - 2010

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