Source controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy

Daniel Kiener, Andrew M. Minor

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Translated title of the contributionSource controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy
Original languageEnglish
Pages (from-to)1328-1337
JournalActa materialia
Volume59
DOIs
Publication statusPublished - 2011

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