Size effect in metallic thin films characterized by low-temperature X-ray diffraction

Ernst Eiper, Klaus Jürgen Martinschitz, Gerhard Dehm, Jozef Keckes

Research output: Contribution to conference › Poster › Research › peer-review

Translated title of the contribution	Size effect in metallic thin films characterized by low-temperature X-ray diffraction
Original language	English
Publication status	Published - 2006
Event	Gordon Research Conference on thin film & small scale mechanical behavior - Waterville, United States Duration: 30 Jul 2006 → 4 Aug 2006

Conference	Gordon Research Conference on thin film & small scale mechanical behavior
Country/Territory	United States
City	Waterville
Period	30/07/06 → 4/08/06

Cite this

@conference{36fed0b04a184904a822b21f39f8b836,

title = "Size effect in metallic thin films characterized by low-temperature X-ray diffraction",

author = "Ernst Eiper and Martinschitz, {Klaus J{\"u}rgen} and Gerhard Dehm and Jozef Keckes",

year = "2006",

language = "English",

note = "Gordon Research Conference on thin film & small scale mechanical behavior ; Conference date: 30-07-2006 Through 04-08-2006",

}

Size effect in metallic thin films characterized by low-temperature X-ray diffraction. / Eiper, Ernst; Martinschitz, Klaus Jürgen; Dehm, Gerhard et al.
2006. Poster session presented at Gordon Research Conference on thin film & small scale mechanical behavior, Waterville, Maine, United States.

Research output: Contribution to conference › Poster › Research › peer-review