Sensitivity and Quantitativity in Atom Probe Tomography

Frédéric Danoix, A Bostel, Harald Leitner, P Jessner, X Sauvage, M. Gouné, R Danoix

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Translated title of the contribution	Sensitivity and Quantitativity in Atom Probe Tomography
Original language	English
Pages (from-to)	258-259
Journal	Microscopy and microanalysis
DOIs	https://doi.org/10.1017/S1431927609098195
Publication status	Published - 2009

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title = "Sensitivity and Quantitativity in Atom Probe Tomography",

author = "Fr{\'e}d{\'e}ric Danoix and A Bostel and Harald Leitner and P Jessner and X Sauvage and M. Goun{\'e} and R Danoix",

year = "2009",

doi = "10.1017/S1431927609098195",

language = "English",

pages = "258--259",

journal = "Microscopy and microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

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TY - JOUR

T1 - Sensitivity and Quantitativity in Atom Probe Tomography

AU - Danoix, Frédéric

AU - Bostel, A

AU - Leitner, Harald

AU - Jessner, P

AU - Sauvage, X

AU - Gouné, M.

AU - Danoix, R

PY - 2009

Y1 - 2009

U2 - 10.1017/S1431927609098195

DO - 10.1017/S1431927609098195

M3 - Article

SN - 1431-9276

SP - 258

EP - 259

JO - Microscopy and microanalysis

JF - Microscopy and microanalysis

ER -