Selective interface toughness measurements of layered thin films

Ruth Konetschnik, Rostislav Daniel, R Brunner, Daniel Kiener

Research output: Contribution to journal › Article › Research › peer-review

4 Citations (Scopus)

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@article{25548c7240b34eb68b3853546df307cc,

title = "Selective interface toughness measurements of layered thin films",

author = "Ruth Konetschnik and Rostislav Daniel and R Brunner and Daniel Kiener",

year = "2017",

doi = "http://dx.doi.org/10.1063/1.4978337",

language = "English",

pages = "035307--1",

journal = "AIP Advances",

issn = "2158-3226",

publisher = "American Institute of Physics Publising LLC",

number = "7",

}