Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer

Andrei I. Benediktovitch, Tatjana Ulyanenkova, Jozef Keckes, Alex P. Ulyanenkov

Research output: Contribution to journalArticleResearchpeer-review

5 Citations (Scopus)
Translated title of the contributionSample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer
Original languageEnglish
Pages (from-to)1931-938
JournalJournal of applied crystallography
DOIs
Publication statusPublished - 2014

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