Rapid determination of stress factors and residual stresses in anisotropic thin films

Klaus-Jürgen Martinschitz, Ernst Eiper, Jozef Keckes

Research output: Contribution to conferencePosterResearchpeer-review

Translated title of the contributionRapid determination of stress factors and residual stresses in anisotropic thin films
Original languageEnglish
Publication statusPublished - 2006
Event55th Annual Denver X-ray Conference - Denver, United States
Duration: 7 Aug 200611 Aug 2006

Conference

Conference55th Annual Denver X-ray Conference
Country/TerritoryUnited States
CityDenver
Period7/08/0611/08/06

Cite this