Translated title of the contribution | Rapid determination of stress factors and residual stresses in anisotropic thin films |
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Original language | English |
Publication status | Published - 2006 |
Event | 55th Annual Denver X-ray Conference - Denver, United States Duration: 7 Aug 2006 → 11 Aug 2006 |
Conference
Conference | 55th Annual Denver X-ray Conference |
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Country/Territory | United States |
City | Denver |
Period | 7/08/06 → 11/08/06 |