Quantitative Approaches for in situ SEM and TEM Deformation Studies

Gerhard Dehm, Daniel Kiener, Christian Motz, Reinhard Pippan, Martin Smolka

Research output: Contribution to journal › Article › Research › peer-review

Translated title of the contribution	Quantitative Approaches for in situ SEM and TEM Deformation Studies
Original language	English
Pages (from-to)	736-737
Journal	Microscopy and microanalysis
Volume	18
DOIs	https://doi.org/10.1017/S1431927612005533
Publication status	Published - 2012

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title = "Quantitative Approaches for in situ SEM and TEM Deformation Studies",

author = "Gerhard Dehm and Daniel Kiener and Christian Motz and Reinhard Pippan and Martin Smolka",

year = "2012",

doi = "10.1017/S1431927612005533",

language = "English",

volume = "18",

pages = "736--737",

journal = "Microscopy and microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

}

TY - JOUR

T1 - Quantitative Approaches for in situ SEM and TEM Deformation Studies

AU - Dehm, Gerhard

AU - Kiener, Daniel

AU - Motz, Christian

AU - Pippan, Reinhard

AU - Smolka, Martin

PY - 2012

Y1 - 2012

U2 - 10.1017/S1431927612005533

DO - 10.1017/S1431927612005533

M3 - Article

SN - 1431-9276

VL - 18

SP - 736

EP - 737

JO - Microscopy and microanalysis

JF - Microscopy and microanalysis

ER -