Observation of an electrical breakdown at ZnO Schottky contacts in varistors

Benjamin Kaufmann, Thomas Billovits, Peter Supancic

Research output: Contribution to journalArticleResearchpeer-review

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)1969-1974
JournalJournal of the European Ceramic Society
Volume41
Issue number3
DOIs
Publication statusPublished - 2021

Keywords

  • Electrical breakdown
  • I-V characteristics
  • Micro 4-point probe method
  • Schottky barrier
  • ZnO varistors

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