Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis

Alexander M. Korsunsky, E. Salvati, A.G.J. Lunt, T. Sui, Z.M. Mughal, Rostislav Daniel, Jozef Keckes, E. Bemporad, M. Sebastiani

Research output: Contribution to journalArticleResearchpeer-review

37 Citations (Scopus)
Original languageEnglish
Pages (from-to)55-64
JournalMaterials and Design
Volume145
DOIs
Publication statusPublished - 2018

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