Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy

Sascha Kremmer, Harald Wurmbauer, Andrei Andreev, Christian Teichert, G. Tallarida, S. Spiga, C. Wiemer, M. Fanciulli

Research output: Contribution to conferencePosterResearchpeer-review

Translated title of the contributionNano-scale characterization of high-k dielectric materials by conducting atomic force microscopy
Original languageEnglish
Publication statusPublished - 2006
Event14th International Winterschool on New Developments in Solid State Physics - Mauterndorf, Austria
Duration: 13 Feb 200617 Feb 2006

Conference

Conference14th International Winterschool on New Developments in Solid State Physics
Country/TerritoryAustria
CityMauterndorf
Period13/02/0617/02/06

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