Nano-beam-x-ray diffraction reveals strain, composition, texture and crystal size gradients across nano-crystalline thin films

Jozef Keckes, Rostislav Daniel, M. Bartosik, Christian Mitterer, S Schoeder, M. Burghammer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Translated title of the contributionNano-beam-x-ray diffraction reveals strain, composition, texture and crystal size gradients across nano-crystalline thin films
Original languageEnglish
Title of host publicationProceeding of International Conference on Metallurgical Coatings and Thin Films
Pages55-55
Publication statusPublished - 2011

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