Morphology characterization and friction coefficient determination of sputtered V2O5 films

Thomas Klünsner, Quan Shen, G Hlawacek, Christian Teichert, Nazanin Fateh, Gerardo Fontalvo, Christian Mitterer

Research output: Contribution to journal › Article › Research › peer-review

8 Citations (Scopus)

Translated title of the contribution	Morphology characterization and friction coefficient determination of sputtered V2O5 films
Original language	English
Pages (from-to)	1416-1420
Journal	Thin solid films
Volume	519
DOIs	https://doi.org/10.1016/j.tsf.2010.09.040
Publication status	Published - 2010

Access to Document

@article{b801a374587d42dbabd800ea2a0d4827,

title = "Morphology characterization and friction coefficient determination of sputtered V2O5 films",

author = "Thomas Kl{\"u}nsner and Quan Shen and G Hlawacek and Christian Teichert and Nazanin Fateh and Gerardo Fontalvo and Christian Mitterer",

year = "2010",

doi = "10.1016/j.tsf.2010.09.040",

language = "English",

volume = "519",

pages = "1416--1420",

journal = "Thin solid films",

issn = "0040-6090",

publisher = "Elsevier",

}

TY - JOUR

T1 - Morphology characterization and friction coefficient determination of sputtered V2O5 films

AU - Klünsner, Thomas

AU - Shen, Quan

AU - Hlawacek, G

AU - Teichert, Christian

AU - Fateh, Nazanin

AU - Fontalvo, Gerardo

AU - Mitterer, Christian

PY - 2010

Y1 - 2010

U2 - 10.1016/j.tsf.2010.09.040

DO - 10.1016/j.tsf.2010.09.040

M3 - Article

SN - 0040-6090

VL - 519

SP - 1416

EP - 1420

JO - Thin solid films

JF - Thin solid films

ER -