Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

N. Vaxelaire, H. Proudhon, S. Labat, Christoph Kirchlechner, Jozef Keckes, V. Jaques, S. Ravy, S. Forest, O. Thomas

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21 Citations (Scopus)
Translated title of the contributionMethodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction
Original languageEnglish
Pages (from-to)1-12
JournalNew journal of physics
Publication statusPublished - 2010

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