Method development for the cyclic characterization of thin copper layers for PCB applications

Klaus Fellner, Peter Filipp Fuchs, Gerald Pinter, Thomas Antretter, Thomas Krivec

Research output: Contribution to journalArticleResearchpeer-review

7 Citations (Scopus)
Translated title of the contributionMethod development for the cyclic characterization of thin copper layers for PCB applications
Original languageEnglish
Pages (from-to)53-60
JournalCircuit World
Volume40
DOIs
Publication statusPublished - 2014

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