Lock-in inductive thermography for surface crack detection

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)
Original languageEnglish
Title of host publicationThermosense
Subtitle of host publicationThermal Infrared Applications XL
PublisherSPIE
Volume10661
ISBN (Electronic)9781510618336
DOIs
Publication statusPublished - 1 Jan 2018
EventThermosense: Thermal Infrared Applications XL 2018 - Orlando, United States
Duration: 16 Apr 201819 Apr 2018

Conference

ConferenceThermosense: Thermal Infrared Applications XL 2018
Country/TerritoryUnited States
CityOrlando
Period16/04/1819/04/18

Keywords

  • Crack depth
  • Crack detection
  • Eddy current
  • Inductive thermography
  • Lock-in

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