Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

S. V. Kondratenko; V. S. Lysenko; Yu N. Kozyrev; M. Kratzer; D. P. Storozhuk; S. A. Iliash; C. Czibula; C. Teichert

doi:10.1016/j.apsusc.2016.07.148

Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

S. V. Kondratenko, V. S. Lysenko, Yu N. Kozyrev, M. Kratzer, D. P. Storozhuk, S. A. Iliash, C. Czibula, C. Teichert

Research output: Contribution to journal › Article › Research › peer-review

8 Citations (Scopus)

Original language	English
Pages (from-to)	783-789
Number of pages	7
Journal	Applied surface science
Volume	389
DOIs	https://doi.org/10.1016/j.apsusc.2016.07.148
Publication status	Published - 15 Dec 2016

Keywords

Carrier lifetime
Heterostructures
Quantum dots
Recombination processes

Access to Document

10.1016/j.apsusc.2016.07.148

Cite this

@article{d08ed61018be44fb88820c863643d149,

title = "Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy",

keywords = "Carrier lifetime, Heterostructures, Quantum dots, Recombination processes",

author = "Kondratenko, {S. V.} and Lysenko, {V. S.} and Kozyrev, {Yu N.} and M. Kratzer and Storozhuk, {D. P.} and Iliash, {S. A.} and C. Czibula and C. Teichert",

year = "2016",

month = dec,

day = "15",

doi = "10.1016/j.apsusc.2016.07.148",

language = "English",

volume = "389",

pages = "783--789",

journal = "Applied surface science",

issn = "0169-4332",

publisher = "Elsevier",

}

TY - JOUR

T1 - Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

AU - Kondratenko, S. V.

AU - Lysenko, V. S.

AU - Kozyrev, Yu N.

AU - Kratzer, M.

AU - Storozhuk, D. P.

AU - Iliash, S. A.

AU - Czibula, C.

AU - Teichert, C.

PY - 2016/12/15

Y1 - 2016/12/15

KW - Carrier lifetime

KW - Heterostructures

KW - Quantum dots

KW - Recombination processes

UR - http://www.scopus.com/inward/record.url?scp=84982840776&partnerID=8YFLogxK

U2 - 10.1016/j.apsusc.2016.07.148

DO - 10.1016/j.apsusc.2016.07.148

M3 - Article

AN - SCOPUS:84982840776

SN - 0169-4332

VL - 389

SP - 783

EP - 789

JO - Applied surface science

JF - Applied surface science

ER -

Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

Keywords

Access to Document

Other files and links

Cite this