| Translated title of the contribution | LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2 |
|---|---|
| Original language | English |
| Pages (from-to) | 1163-1166 |
| Journal | Journal of electron spectroscopy and related phenomena |
| Volume | 144-147 |
| Publication status | Published - 2005 |
LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2
Christian Teichert, Sascha Kremmer
Research output: Contribution to journal › Article › Research › peer-review
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