Ion-beam-induced bending of semiconductor nanowires

Imran Hanif, Osmane Camara, Matheus A. Tunes, Robert W. Harrison, Graeme Greaves, Stephen E. Donnelly, Jonathan A. Hinks

Research output: Contribution to journalArticleResearchpeer-review

7 Citations (Scopus)
Original languageEnglish
Article number335701
JournalNanotechnology
Volume29
Issue number33
DOIs
Publication statusPublished - 8 Jun 2018
Externally publishedYes

Keywords

  • in situ transmission electron microscopy
  • ion irradiation-induced bending
  • radiation damage
  • semiconductor nanowires

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