Indentation response of a superlattice thin film revealed by in-situ scanning X-ray nanodiffraction

J. Todt, C. Krywka, Z.L. Zhang, P.H. Mayrhofer, J. Keckes, M. Bartosik

Research output: Contribution to journalArticleResearchpeer-review

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)425-432
Number of pages8
JournalActa Materialia
Volume195.2020
Issue number15 August
DOIs
Publication statusPublished - 29 May 2020

Cite this