In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale

Jozef Keckes, Ernst Eiper, Klaus Jürgen Martinschitz, P. Boesecke, Wolfgang Gindl, Gerhard Dehm

Research output: Contribution to journal › Article › Research › peer-review

Translated title of the contribution	In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale
Original language	English
Pages (from-to)	1084-1088
Journal	Advanced Engineering Materials
Publication status	Published - 2006

Cite this

@article{ee811a5b739745d4a1762673819e9a6f,

title = "In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale",

author = "Jozef Keckes and Ernst Eiper and Martinschitz, {Klaus J{\"u}rgen} and P. Boesecke and Wolfgang Gindl and Gerhard Dehm",

year = "2006",

language = "English",

pages = "1084--1088",

journal = "Advanced Engineering Materials",

issn = "1438-1656",

publisher = "Wiley-VCH ",

}

TY - JOUR

T1 - In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale

AU - Keckes, Jozef

AU - Eiper, Ernst

AU - Martinschitz, Klaus Jürgen

AU - Boesecke, P.

AU - Gindl, Wolfgang

AU - Dehm, Gerhard

PY - 2006

Y1 - 2006

M3 - Article

SN - 1438-1656

SP - 1084

EP - 1088

JO - Advanced Engineering Materials

JF - Advanced Engineering Materials

ER -