In-situ TEM investigation of toughening in Silicon at small scales

Inas Issa, Christoph Gammer, Stefan Kolitsch, Anton Hohenwarter, Peter J. Imrich, Reinhard Pippan, Daniel Kiener

Research output: Contribution to journalArticleResearchpeer-review

9 Downloads (Pure)
Original languageEnglish
JournalMaterials today
Early online date3 Jul 2021
DOIs
Publication statusE-pub ahead of print - 3 Jul 2021

Bibliographical note

Publisher Copyright:
© 2021 The Author(s)

Keywords

  • Brittle Ductile Transition (BDT)
  • Fracture toughness
  • In-situ TEM
  • Nanoscale fracture experiments
  • Single crystal (SC) Silicon (Si)
  • Size scale effect
  • Toughening

Cite this