In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings

M. Bartosik, R. Pitonak, Jozef Keckes

Research output: Contribution to journalArticleResearchpeer-review

12 Citations (Scopus)
Translated title of the contributionIn Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings
Original languageEnglish
Pages (from-to)705-711
JournalAdvanced Engineering Materials
Publication statusPublished - 2011

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