Imaging dislocations in gallium nitride across broad areas using atomic force microscopy

S.E. Bennett, David Holec, M.J. Kappers, C.J. Humphreys, R.A. Oliver

Research output: Contribution to journalArticleResearchpeer-review

5 Citations (Scopus)
Translated title of the contributionImaging dislocations in gallium nitride across broad areas using atomic force microscopy
Original languageEnglish
Pages (from-to)0637011-0637017
JournalReview of scientific instruments
DOIs
Publication statusPublished - 2010

Cite this