High resolution determination of local residual stress gradients in single- and multilayer thin film systems

Ruth Treml, Darian Kozic, Johannes Zechner, Xavier Maeder, Hans-Peter Gänser, Ronald Schöngrundner, Johann Michler, Roland Brunner, Daniel Kiener

Research output: Contribution to journalArticleResearchpeer-review

42 Citations (Scopus)
Original languageEnglish
Pages (from-to)616-623
JournalActa materialia
Publication statusPublished - 2016

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