Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films

Richard Rachbauer, David Holec, Lattemann Martina, Hultman Lars, Paul Heinz Mayrhofer

Research output: Contribution to conference › Poster › Research › peer-review

32 Citations (Scopus)

Translated title of the contribution	Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films
Original language	English
Publication status	Published - 2011
Event	ISSC - Warwick, United Kingdom Duration: 4 Apr 2011 → 7 Apr 2011

Cite this

@conference{19d20ada0b9f4329bb1199eb54d0c3db,

title = "Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films",

author = "Richard Rachbauer and David Holec and Lattemann Martina and Hultman Lars and Mayrhofer, {Paul Heinz}",

year = "2011",

language = "English",

note = "ISSC ; Conference date: 04-04-2011 Through 07-04-2011",

}