Electrically reversible cracks in an intermetallic film controlled by an electric field

Z.Q. Liu, J.H. Liu, M.D. Biegalski, J.-M. Hu, S.L. Shang, Y. Ji, J.M. Wang, S.L. Hsu, A.T. Wong, Megan Cordill, B. Gludovatz, C. Marker, H. Yan, Z.X. Feng, L. You, M.W. Lin, T.Z. Ward, Z.K. Liu, C.B. Jiang, L.Q. ChenR.O. Ritchie, H.M. Christen, R. Ramesh

Research output: Contribution to journalArticleResearchpeer-review

32 Citations (Scopus)
Original languageEnglish
Article number9
Number of pages7
JournalNature Communications
Volume41.2018
Issue number9
DOIs
Publication statusPublished - 3 Jan 2018

Cite this