Development of a Distributed Vision System for Industrial Conditions

Michael Weiss, Arnulf Schiller, Paul O'Leary, Ewald Fauster, Peter Schalk

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)91-102
Number of pages12
JournalProceedings of SPIE - The International Society for Optical Engineering
Publication statusPublished - 1 Dec 2003
EventSixth International Conference on Quality Control by Artificial Vision - Gatlinburg, TN, United States
Duration: 19 May 200322 May 2003


  • Distributed measurement and vision systems
  • Fitting
  • Grassmann reduction
  • Planner line coordinates
  • Platform independent communication framework
  • Quality observation at a wire rolling mill
  • Singular value decomposition

Cite this