Translated title of the contribution | Critical thickness for GaN thin film on AlN substrate |
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Original language | English |
Publication status | Published - 2013 |
Event | International Integrated Reliability Workshop - Fallen Leaf Lake, United States Duration: 13 Oct 2013 → 17 Oct 2013 |
Conference
Conference | International Integrated Reliability Workshop |
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Country/Territory | United States |
City | Fallen Leaf Lake |
Period | 13/10/13 → 17/10/13 |