Critical thickness for GaN thin film on AlN substrate

R.A. Coppeta, H Ceric, David Holec, T. Grasser

Research output: Contribution to conferencePosterResearchpeer-review

2 Citations (Scopus)
Translated title of the contributionCritical thickness for GaN thin film on AlN substrate
Original languageEnglish
Publication statusPublished - 2013
EventInternational Integrated Reliability Workshop - Fallen Leaf Lake, United States
Duration: 13 Oct 201317 Oct 2013

Conference

ConferenceInternational Integrated Reliability Workshop
Country/TerritoryUnited States
CityFallen Leaf Lake
Period13/10/1317/10/13

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