Correlation of mechanical damage and electrical behavior of Al/Mo bilayers subjected to bending

Patrice Kreiml; Martin Rausch; Velislava L. Terziyska; Harald Köstenbauer; Jörg Winkler; Christian Mitterer; Megan J. Cordill

doi:10.1016/j.tsf.2019.137480

Correlation of mechanical damage and electrical behavior of Al/Mo bilayers subjected to bending

Patrice Kreiml, Martin Rausch, Velislava L. Terziyska, Harald Köstenbauer, Jörg Winkler, Christian Mitterer, Megan J. Cordill

Research output: Contribution to journal › Article › Research › peer-review

3 Citations (Scopus)

Original language	English
Article number	137480
Journal	Thin solid films
Volume	687
DOIs	https://doi.org/10.1016/j.tsf.2019.137480
Publication status	Published - 1 Oct 2019

Keywords

Aluminum
Bending
Electrical properties
Fracture
Molybdenum
Sputtering
Thin films

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10.1016/j.tsf.2019.137480

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@article{1f52dfb572a54cc7976de142021f254d,

title = "Correlation of mechanical damage and electrical behavior of Al/Mo bilayers subjected to bending",

keywords = "Aluminum, Bending, Electrical properties, Fracture, Molybdenum, Sputtering, Thin films",

author = "Patrice Kreiml and Martin Rausch and Terziyska, {Velislava L.} and Harald K{\"o}stenbauer and J{\"o}rg Winkler and Christian Mitterer and Cordill, {Megan J.}",

year = "2019",

month = oct,

day = "1",

doi = "10.1016/j.tsf.2019.137480",

language = "English",

volume = "687",

journal = "Thin solid films",

issn = "0040-6090",

publisher = "Elsevier",

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TY - JOUR

T1 - Correlation of mechanical damage and electrical behavior of Al/Mo bilayers subjected to bending

AU - Kreiml, Patrice

AU - Rausch, Martin

AU - Terziyska, Velislava L.

AU - Köstenbauer, Harald

AU - Winkler, Jörg

AU - Mitterer, Christian

AU - Cordill, Megan J.

PY - 2019/10/1

Y1 - 2019/10/1

KW - Aluminum

KW - Bending

KW - Electrical properties

KW - Fracture

KW - Molybdenum

KW - Sputtering

KW - Thin films

UR - http://www.scopus.com/inward/record.url?scp=85070419155&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2019.137480

DO - 10.1016/j.tsf.2019.137480

M3 - Article

AN - SCOPUS:85070419155

SN - 0040-6090

VL - 687

JO - Thin solid films

JF - Thin solid films

M1 - 137480

ER -

Correlation of mechanical damage and electrical behavior of Al/Mo bilayers subjected to bending

Keywords

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