Correlation between internal states and creep resistance in metallic glass thin films

M. Li, J. Tan, X. M. Qin, D. H. Lu, Z. X. Feng, C. J. Li, S. V. Ketov, M. Calin, J. Eckert

Research output: Contribution to journalArticleResearchpeer-review

2 Citations (Scopus)
Original languageEnglish
Article number085302
JournalJournal of applied physics
Issue number8
Publication statusPublished - 28 Feb 2021

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