Correlation between internal states and creep resistance in metallic glass thin films

M. Li; J. Tan; X. M. Qin; D. H. Lu; Z. X. Feng; C. J. Li; S. V. Ketov; M. Calin; J. Eckert

doi:10.1063/5.0039754

Correlation between internal states and creep resistance in metallic glass thin films

M. Li, J. Tan, X. M. Qin, D. H. Lu, Z. X. Feng, C. J. Li, S. V. Ketov, M. Calin, J. Eckert

Research output: Contribution to journal › Article › Research › peer-review

2 Citations (Scopus)

Original language	English
Article number	085302
Journal	Journal of applied physics
Volume	129
Issue number	8
DOIs	https://doi.org/10.1063/5.0039754
Publication status	Published - 28 Feb 2021

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© 2021 Author(s).

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title = "Correlation between internal states and creep resistance in metallic glass thin films",

author = "M. Li and J. Tan and Qin, {X. M.} and Lu, {D. H.} and Feng, {Z. X.} and Li, {C. J.} and Ketov, {S. V.} and M. Calin and J. Eckert",

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language = "English",

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T1 - Correlation between internal states and creep resistance in metallic glass thin films

AU - Li, M.

AU - Tan, J.

AU - Qin, X. M.

AU - Lu, D. H.

AU - Feng, Z. X.

AU - Li, C. J.

AU - Ketov, S. V.

AU - Calin, M.

AU - Eckert, J.

PY - 2021/2/28

Y1 - 2021/2/28

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U2 - 10.1063/5.0039754

DO - 10.1063/5.0039754

M3 - Article

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SN - 0021-8979

VL - 129

JO - Journal of applied physics

JF - Journal of applied physics

IS - 8

M1 - 085302

ER -

Correlation between internal states and creep resistance in metallic glass thin films

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