Conductive Atomic Force Microscopy investigations of organic thin films

A. Pavitschitz; I. Beinik; M. Kratzer; Christian Teichert; G. Schwabegger; H. Sitter; C. Simbrunner; Thomas Grießer; Wolfgang Kern

Conductive Atomic Force Microscopy investigations of organic thin films

A. Pavitschitz, I. Beinik, M. Kratzer, Christian Teichert, G. Schwabegger, H. Sitter, C. Simbrunner, Thomas Grießer, Wolfgang Kern

Research output: Contribution to conference › Poster › Research › peer-review

Translated title of the contribution	Conductive Atomic Force Microscopy investigations of organic thin films
Original language	English
Publication status	Published - 2009
Event	59. Jahrestagung der Österreichischen Physikalischen Gesellschaft - Innsbruck, Austria Duration: 2 Sept 2009 → 4 Sept 2009

Conference

Conference	59. Jahrestagung der Österreichischen Physikalischen Gesellschaft
City	Innsbruck, Austria
Period	2/09/09 → 4/09/09

Cite this

@conference{9257637bb4b8403ba2e614997950e0c0,

title = "Conductive Atomic Force Microscopy investigations of organic thin films",

author = "A. Pavitschitz and I. Beinik and M. Kratzer and Christian Teichert and G. Schwabegger and H. Sitter and C. Simbrunner and Thomas Grie{\ss}er and Wolfgang Kern",

year = "2009",

language = "English",

note = "59. Jahrestagung der {\"O}sterreichischen Physikalischen Gesellschaft ; Conference date: 02-09-2009 Through 04-09-2009",

}

TY - CONF

T1 - Conductive Atomic Force Microscopy investigations of organic thin films

AU - Pavitschitz, A.

AU - Beinik, I.

AU - Kratzer, M.

AU - Teichert, Christian

AU - Schwabegger, G.

AU - Sitter, H.

AU - Simbrunner, C.

AU - Grießer, Thomas

AU - Kern, Wolfgang

PY - 2009

Y1 - 2009

M3 - Poster

T2 - 59. Jahrestagung der Österreichischen Physikalischen Gesellschaft

Y2 - 2 September 2009 through 4 September 2009

ER -