Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration

Igor Beinik, B. Galiana, Markus Kratzer, I. Rey-Stolle, C. Algora, Paloma Tejedor, Christian Teichert

Research output: Contribution to conferencePosterResearchpeer-review

Translated title of the contributionComplementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration
Original languageEnglish
Publication statusPublished - 2010
Event16th International Winterschool on New Developments in Solid State Physics: Low Dimensional Systems "Mauterndorf 2010" - Mauterndorf, Austria
Duration: 22 Feb 201026 Feb 2010

Conference

Conference16th International Winterschool on New Developments in Solid State Physics: Low Dimensional Systems "Mauterndorf 2010"
Country/TerritoryAustria
CityMauterndorf
Period22/02/1026/02/10

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