Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films

Ernst Eiper, Klaus-Jürgen Martinschitz, Jozef Keckes

Research output: Contribution to journalArticleResearchpeer-review

15 Citations (Scopus)
Translated title of the contributionCombined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films
Original languageEnglish
Pages (from-to)25-29
JournalPowder diffraction
Volume21
DOIs
Publication statusPublished - 2006

Cite this