Original language | English |
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Pages (from-to) | 42-51 |
Number of pages | 10 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 5303 |
DOIs | |
Publication status | Published - 1 Dec 2004 |
Event | Machine Vision Applications in Industrial Inspection XII - San Jose, CA, United States Duration: 21 Jan 2004 → 22 Jan 2004 |
Keywords
- Camera calibration
- Data segmentation
- Edge inspection
- Fitting
- Visual inspection