Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals

Pilar F. De Pablos; Petro L. De Andres; F. Ladstädter; U. Hohenester; Peter Puschnig; Claudia Draxl; Francisco J. Garcia-Vidal; Fernando Flores

doi:10.1063/1.1639790

Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals

Pilar F. De Pablos, Petro L. De Andres, F. Ladstädter, U. Hohenester, Peter Puschnig, Claudia Draxl, Francisco J. Garcia-Vidal, Fernando Flores

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Translated title of the contribution	Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals
Original language	English
Title of host publication	Scanning tunnelling microscopy/spectroscopy and related techniques
Subtitle of host publication	12th International Conference STM'03
Publisher	AIP Publishing
Pages	829
Number of pages	836
DOIs	https://doi.org/10.1063/1.1639790
Publication status	Published - 2003

Publication series

Name	AIP Conference Proceedings
Volume	696
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Access to Document

10.1063/1.1639790

Cite this

De Pablos, P. F., De Andres, P. L., Ladstädter, F., Hohenester, U., Puschnig, P., Draxl, C., Garcia-Vidal, F. J., & Flores, F. (2003). Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals. In Scanning tunnelling microscopy/spectroscopy and related techniques: 12th International Conference STM'03 (pp. 829). (AIP Conference Proceedings; Vol. 696). AIP Publishing. https://doi.org/10.1063/1.1639790

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title = "Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals",

author = "{De Pablos}, {Pilar F.} and {De Andres}, {Petro L.} and F. Ladst{\"a}dter and U. Hohenester and Peter Puschnig and Claudia Draxl and Garcia-Vidal, {Francisco J.} and Fernando Flores",

year = "2003",

doi = "10.1063/1.1639790",

language = "English",

series = "AIP Conference Proceedings",

publisher = " AIP Publishing",

pages = "829",

booktitle = "Scanning tunnelling microscopy/spectroscopy and related techniques",

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De Pablos, PF, De Andres, PL, Ladstädter, F, Hohenester, U, Puschnig, P, Draxl, C, Garcia-Vidal, FJ & Flores, F 2003, Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals. in Scanning tunnelling microscopy/spectroscopy and related techniques: 12th International Conference STM'03. AIP Conference Proceedings, vol. 696, AIP Publishing, pp. 829. https://doi.org/10.1063/1.1639790

Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals. / De Pablos, Pilar F.; De Andres, Petro L.; Ladstädter, F. et al.
Scanning tunnelling microscopy/spectroscopy and related techniques: 12th International Conference STM'03. AIP Publishing, 2003. p. 829 (AIP Conference Proceedings; Vol. 696).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals

AU - De Pablos, Pilar F.

AU - De Andres, Petro L.

AU - Ladstädter, F.

AU - Hohenester, U.

AU - Puschnig, Peter

AU - Draxl, Claudia

AU - Garcia-Vidal, Francisco J.

AU - Flores, Fernando

PY - 2003

Y1 - 2003

U2 - 10.1063/1.1639790

DO - 10.1063/1.1639790

M3 - Conference contribution

T3 - AIP Conference Proceedings

SP - 829

BT - Scanning tunnelling microscopy/spectroscopy and related techniques

PB - AIP Publishing

ER -

De Pablos PF, De Andres PL, Ladstädter F, Hohenester U, Puschnig P, Draxl C et al. Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals. In Scanning tunnelling microscopy/spectroscopy and related techniques: 12th International Conference STM'03. AIP Publishing. 2003. p. 829. (AIP Conference Proceedings). doi: 10.1063/1.1639790