Translated title of the contribution | Atom probe specimen preparation and 3D interfacial study of Ti-Al-N thin films |
---|---|
Original language | English |
Pages (from-to) | 1811-1816 |
Journal | Surface & coatings technology |
Volume | 204 |
DOIs | |
Publication status | Published - 2010 |
Atom probe specimen preparation and 3D interfacial study of Ti-Al-N thin films
Richard Rachbauer, S. Massl, Erich Stergar, P. Felfer, Paul Heinz Mayrhofer
Research output: Contribution to journal › Article › Research › peer-review
35
Citations
(Scopus)