Translated title of the contribution | AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2 |
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Original language | German |
Publication status | Published - 2010 |
Event | ÖPG 2010 - Salzburg, Austria Duration: 6 Sept 2010 → 10 Sept 2010 |
Conference
Conference | ÖPG 2010 |
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Abbreviated title | ÖPG 2010 |
Country/Territory | Austria |
City | Salzburg |
Period | 6/09/10 → 10/09/10 |