Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiOx-Si Multilayer

Markus Alfreider; Johannes Zechner; Daniel Kiener

doi:10.1007/s11837-020-04444-6

Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiO_x-Si Multilayer

Markus Alfreider, Johannes Zechner, Daniel Kiener

Chair of Materials Physics (430)

KAI Kompetenzzentrum Automobil- u. Industrieelektronik GmbH

Research output: Contribution to journal › Article › Research › peer-review

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Original language	English
Pages (from-to)	4551-4558
Number of pages	8
Journal	JOM
Volume	72.2020
Issue number	12
DOIs	https://doi.org/10.1007/s11837-020-04444-6
Publication status	Published - 10 Nov 2020

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10.1007/s11837-020-04444-6

M. Alfreider, J. Zechner, D. Kiener 2020 (JOM 72, 4551–4558)Final published version, 1.64 MBLicence: CC BY

Cite this

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Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiOx-Si Multilayer

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Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiO_x-Si Multilayer