A versatile atomic force microscope integrated with a scanning electron microscope

Joseph Kreith, T. Strunz, E.J. Fantner, G.E. Fantner, Megan Cordill

Research output: Contribution to journal › Article › Research › peer-review

16 Citations (Scopus)

Original language	English
Article number	053704
Journal	Review of scientific instruments
Volume	88
Issue number	5
Publication status	Published - 2017

Cite this

@article{d70dc6e407a24d4ebe3f04e0b75b3a84,

title = "A versatile atomic force microscope integrated with a scanning electron microscope",

author = "Joseph Kreith and T. Strunz and E.J. Fantner and G.E. Fantner and Megan Cordill",

year = "2017",

language = "English",

volume = "88",

journal = "Review of scientific instruments",

issn = "0034-6748",

publisher = "American Institute of Physics Publising LLC",

number = "5",

}