A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction

Katharina Babinsky, R. De Kloe, Helmut Clemens, Sophie Primig

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75 Citations (Scopus)
Translated title of the contributionA novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction
Original languageEnglish
Pages (from-to)9-18
JournalUltramicroscopy
Volume144
DOIs
Publication statusPublished - 2014

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